Free Keithley Web-Based Seminar Addresses High Voltage Wafer Level Test Techniques 

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “High Voltage Wafer Level Test - Tips, Tricks, and Pitfalls” on Thursday, April 14, 2011.

by JD Drake Monday, April 04, 2011
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled “High Voltage Wafer Level Test - Tips, Tricks, and Pitfalls” on Thursday, April 14, 2011. This one-hour seminar will identify, discuss, and propose solutions for a number of challenges related to high voltage wafer level parametric test. To register for this event, visit www.keithley.com/events/semconfs/webseminars.

Many parametric test engineers are learning to cope with new high voltage process requirements. High voltage processes require high voltage parametric testing for process control and reliability monitoring. Part of the challenge is that these new high voltage requirements add to the list of parametric tests rather than replace it. In many if not most cases, the high voltage transistors are controlled by complex logic that requires low voltage/low current parametric test. Consequently, both high voltage and logic level tests need to be realized within the same test plan with a minimum impact on throughput. Automated test equipment configuration and test plan development play a critical role in success.

The seminar will address a variety of topics:
• High voltage probe card requirements
• Hot switching and cable charging risks
• Protecting low voltage instruments during high voltage testing
• High voltage parametric test roadmap

This seminar is recommended for test department engineers and managers in the semiconductor industry who are interested in learning more about the practical issues related to high voltage parametric test and characterization in a production environment.

Paul Meyer, the web seminar presenter, is a senior staff technologist for the Semiconductor Measurements Group at Keithley Instruments, Cleveland, Ohio, which is part of the Tektronix test and measurement portfolio. Prior to joining Keithley, Paul’s career included designing semiconductor fab equipment, as well as equipment and equipment engineering in semiconductor fabs.

For More Information
To register to participate in the online seminar, which will be broadcast on Thursday, April 14, at 15:00 CEST (9:00 AM EDT) for Europe and at 2:00 PM EDT for North America, visit www.keithley.com/events/semconfs/webseminars. To learn more about Keithley, contact the company at:

Telephone: 888-534-8453, 440-248-0400
FAX: 440-248-6168
E-mail: publisher@keithley.comInternet: www.keithley.com
Address:Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891

About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio.

Products and company names listed are trademarks or trade names of their respective companies.

0    submitted by JD Drake
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